Dummy Fill Insertion Considering Density Uniformity Constraint
碩士 === 國立清華大學 === 資訊工程學系 === 103 === As the shrinking of device geometries scale, there is an inevitable need for better planarization of the multilevel interconnect structures. To meet today's advanced lithography methods, we need a planar surface. Or may leads to bad lithography results. CHEM...
Main Authors: | Chang, Jui Lin, 張瑞麟 |
---|---|
Other Authors: | Mak, Wai Kei |
Format: | Others |
Language: | en_US |
Published: |
2015
|
Online Access: | http://ndltd.ncl.edu.tw/handle/50283128130795917427 |
Similar Items
-
Dummy Metal Insertion Based on Density Gradient Minimization with Coupling Constraints
by: Szu-Jui Chou, et al.
Published: (2007) -
Coupling Capacitance and ECP-Aware Dummy Metal Fill for Layout Uniformity in Cu Process
by: Yu-Lun Co, et al.
Published: (2007) -
Fast and Model-Based algorithm for dummy pattern insertion in layout uniformity of chemical mechanical polishing
by: 隋志暉
Published: (2006) -
IC layout optimization by dummy filling methods
by: Lin, Sheng-Che, et al.
Published: (2010) -
Quantification of Impact by Nanometer Dummy Metal Fills
by: Jyh-Jeng Chou, et al.
Published: (2007)