Dummy Fill Insertion Considering Density Uniformity Constraint

碩士 === 國立清華大學 === 資訊工程學系 === 103 === As the shrinking of device geometries scale, there is an inevitable need for better planarization of the multilevel interconnect structures. To meet today's advanced lithography methods, we need a planar surface. Or may leads to bad lithography results. CHEM...

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Bibliographic Details
Main Authors: Chang, Jui Lin, 張瑞麟
Other Authors: Mak, Wai Kei
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/50283128130795917427

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