Program Interference and Retention Error Characteristic Measurement and Analysis for NAND Flash Memory

碩士 === 國立臺北大學 === 通訊工程研究所 === 104 === Recently, NAND flash memory has been the mainstream of storage medium for portable consumer electronic devices, such as mobile phone, laptop and solid state disk (SSD). Meanwhile, manufacturers are striving to reduce the cost by scaling down to smaller process a...

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Bibliographic Details
Main Authors: Nian-Zhu Liu, 劉念竹
Other Authors: Shin-Lin Shieh
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/60337418428035875464