First-principles Calculations on Fracture Toughness Prediction of Ni-doped Cu6Sn5 Intermetallic Compounds

碩士 === 國立臺灣大學 === 土木工程學研究所 === 103 === Intermetallic compounds (IMC) which appear in the interface of Sn solders and Cu substrate play an important role in quality control in electronic packaging industry. In the system, it has been reported that IMC can be stabilized in eta phase Cu6Sn5 by adding N...

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Bibliographic Details
Main Authors: Chih-Chuen Lin, 林致淳
Other Authors: Chuin-Shan Chen
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/99776523326706541052