Properties of native oxide on InAsPSbstudied by X-ray photoelectron spectroscopy
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === In this thesis, we demonstrate the properties of native oxide on InAsPSb studied by X-ray Photoelectron Spectroscopy. We utilize peak area ratio, VFF model, valence band spectra, oxide layer thickness and oxide composition to analyze the native oxide layer. Fro...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/38239634374776053533 |