Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories
碩士 === 國立臺灣科技大學 === 電機工程系 === 103 === In recent years, very-large-scale integration (VLSI) technology continues to progress very fast. The number of transistors and the density of embedded memories are also increasing rapidly. This result threats the yield and the reliability of embedded memories se...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/69071005612914664675 |