A case study of the comparison between applicant and examiner citations in U.S. patents

碩士 === 國立臺灣科技大學 === 專利研究所 === 103 === The information of U.S. patent citations include applicants’ citation and examiners’ citation, and all reflect the relevance between citing patents and cited patents, but whether the degree of relevance between the two is different? For example, a patent its nu...

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Bibliographic Details
Main Authors: Yen-Ting Ko, 柯彥廷
Other Authors: none
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/13282147721249238956