Reliability of extended fin width on FinFEts

碩士 === 國立高雄大學 === 電機工程學系碩士班 === 103 === This thesis addresses the characteristics of nFinFETs with different channel width, extended width with increasing of fin and with wire bonding connection. The measurements show that the nFinFET with thicker width has higher current than thinner ones, and even...

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Bibliographic Details
Main Authors: Yu-Yen Ho, 何俞彥
Other Authors: Wen-Teng Chang
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/10086131558924616879