Texture and physical characterization of BiFeO3 thin films with different underlayers

碩士 === 東海大學 === 應用物理學系 === 103 === In this present work, BiFeO3 (BFO)thin films with 200 nm in thickness were deposited on both glass and SiO2/Si(100) substrates by rf magnetron sputtering. Structure and ferroelectric properties of BFO films with different underlayers have been investigated. The exp...

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Bibliographic Details
Main Authors: Shang-You Tu, 杜尚祐
Other Authors: Huang-Wei Chang
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/94859663987512800897