Segmented FDR Test Data Compression
碩士 === 元智大學 === 資訊工程學系 === 103 === In the field of VLSI testing, the density of integrated circuits increases as the result of the VLSI technology grows up. Hence, testing for integrated circuit is more and more complex. Such as the huge growth of the test time, high power consumption and bandwidth...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/42099538350220189989 |