Study Taguchi experimental method used in Thinning Wafer Cutting Process Quality

碩士 === 逢甲大學 === 工業工程與系統管理學系 === 104 === In this paper, IC semiconductor packaging industry for the study, along with the advancement of technology, integrated circuit (Integrated Circuit, IC) towards the fast, multi-performance, high reliability and overall slim and light direction, the wafer thinni...

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Bibliographic Details
Main Authors: Chien-Ting Chen, 陳建廷
Other Authors: Feng-Tsung Cheng
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/75suus