Study of Automatic Machine Vision for Exterior Defection and Rapid Inspection of BGA/QFN Packages

碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 104 === With the speedy development of science and technology,semiconductor manufacturing technology is keeping improvement, also the package technology of semiconductors is developed toward an era of smaller, more sophisticated generation as well. In addition th...

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Bibliographic Details
Main Authors: WANG,YUNG-REN, 王裕仁
Other Authors: HORNG,MONG-FONG
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/vp9md9