An Integrated Model of Data Mining and Time Series in Predicting Variations of Semiconductor Components
碩士 === 國立成功大學 === 工業與資訊管理學系碩士在職專班 === 104 === The study constructs a non-sensor semiconductor components variation prediction model, in which a data-mining framework is proposed based on clustering and decision-tree methods to mine solder bumps of flip-chip package measurement data and defect rates...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/53817194902523063992 |