Characterizing and Optimizing the Morphology of Graphene Films

碩士 === 國立成功大學 === 材料科學及工程學系 === 104 === We have applied novel characterization methods to the optimization of graphene thin films. Traditional measurement techniques such as resistance measurements and microscopy can only reveal global or local properties, such as uniformity or selected morphologies...

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Bibliographic Details
Main Authors: Ming-ChunLee, 李明駿
Other Authors: Mario Hofmann
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/09771439807031923975