ICE-RADAR: In-situ, Cost-Effective Razor Flip-Flop Deployment for Aging Resilience
碩士 === 國立交通大學 === 資訊科學與工程研究所 === 104 === Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. Aggressive technology scaling trends, such as thinner gate oxide without proportional downscaling of su...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/fb5he9 |