Random Telegraph Signals in Nanoscale FETs: 3D Statistical Variability Models and Trapping/De-trapping Kinetics Analysis
博士 === 國立交通大學 === 電子工程學系 電子研究所 === 104 === For the design of future circuits, it is essential to examine the statistical variability associated with the development of nanoscale devices. In this thesis, we study such current and threshold voltage disturbances due to the random telegraph signals (RTS...
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| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/7gm9pv |