Effects of die thickness and location of Cu pillar bump on structural stresses in a package under the conditions of thermal compression bonding process and temperature cycling.

碩士 === 國立屏東科技大學 === 材料工程研究所 === 104 === This study investigates the effects of die thickness and location of Cu pillar bump on structural stresses in a package under the conditions of thermal compression bonding process and temperature cycling using ANSYS. This package was fabricated by thermally co...

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Bibliographic Details
Main Authors: Lin, Jhih-Hao, 林志豪
Other Authors: Lu, Wei-Hua
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/87874109334116133316