Physical Mechanism and Reliability Analysis on Advanced SOI MOSFETs and FinFETs

博士 === 國立中山大學 === 物理學系研究所 === 104 === Recently, electronic products combining display panels, memory devices, and portable devices have become more popular for consumers. These electronic products are mostly composed of metal-oxide-semiconductor field effect transistors (MOSFETs). It is due to MOSFE...

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Bibliographic Details
Main Authors: Kuan-Ju Liu, 劉冠汝
Other Authors: Ting-Chang Chang
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/cq2b52