Efficient Probing Schemes for Fine-Pitch Pads of InFO Wafer-Level Chip-Scale Package

碩士 === 國立清華大學 === 電機工程學系 === 104 === With the increasing demand of super high scale of integration and small form factor in advanced semiconductor products, especially those that integrate DRAM and logic dies, 3D IC and Wafer-Level Chip-Scale Packaging (WLCSP) are considered promising approaches. In...

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Bibliographic Details
Main Authors: Huang Yu Chieh, 黃裕傑
Other Authors: Wu, Cheng Wen
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/64107426437393956996