Investigation on characteristics of tantalum/molydenum and titanium/zirconium isomorphous alloy gates on hafnium oxide dielectrics

碩士 === 國立聯合大學 === 材料科學工程學系碩士班 === 104 === High-k/metal gate (HKMG) technology has become the mainstream in high-performance logic devices for sub 45 nm technology nodes. In this research, we will integrate the HKMG structure for the next generation transistor. We will deposit an amorphous metal allo...

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Bibliographic Details
Main Authors: YU, HUNG-YI, 余泓毅
Other Authors: LAI, YI-SHENG
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/g57snf