Segmented LFSR Reseeding For Test Data Compression
碩士 === 元智大學 === 資訊工程學系 === 104 === Test data compression is a popular topic in VLSI testing. It is the key factor that will determine the quality for the final testing results. Built-in-self-test (BIST) is a technique which can test itself and verify the correctness of the circuit under test without...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/43666344224392480070 |