A Semiconductor Wafer Defect Automatic Identification Technology Apply to Diversity Appearance
碩士 === 中華大學 === 電機工程學系 === 105 === In recent years, mobile devices and Internet of Things are emerging,bring people more convenient life. Therefore, Electronic components made of semiconductor wafers is also a large and fast production, More than hundred level of the production process, The most c...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/16708996036303899662 |