TFT-LCD Packing Barcode Defect Inspection by AOI

碩士 === 國立中興大學 === 機械工程學系所 === 105 === Since 1974, the Barcode system has been developed, it was widely applied for industry product, business data and private medical insurance, just as recorded production year, grade and code it was played an important role in the TFT-LCD packing process. Normally...

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Bibliographic Details
Main Authors: Ching-Jiun Wang, 王清俊
Other Authors: Ji-Chun Lee
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/k3hxv7