Simulation Studies for Negative Capacitance Transistor: From Planar to Fin Structure

碩士 === 國立中興大學 === 電機工程學系所 === 105 === In order to overcome the physical limitation of the device scaling, the ferroelectric (FE) with a negative capacitance effect can be applied to solve this kind of problem, so that Subthreshold Swing (SS) can be lower to 60 mV / dec and the effect of device quick...

Full description

Bibliographic Details
Main Authors: Yi-Lu Dai, 戴易錄
Other Authors: Shu-Tong Chang
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/58692520367840513500