Mitigating the heal storm problem in multi-channel self-healing SSDs
碩士 === 國立交通大學 === 資訊科學與工程研究所 === 105 === The flash storage density continues to increase because of high cost per bit. However, it causes worse flash endurance and short life time is a critical issue of the popularity of NAND flash memory. Recent studies show that worn-out block can be healed by hea...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31522591613403619706 |