Atomic Layer Deposited TiO2 Thin Films for the Surface Passivation of p-type Crystalline Silicon

碩士 === 國立交通大學 === 照明與能源光電研究所 === 105 === In this study, titanium oxide(TiO2)films were grown on FZ p-type Si substrates by an atomic layer deposition(ALD)system with TiCl4 and H2O precursors at different temperatures(80°C, 100°C, 150°C and 200°C). The crystal structure, surface roughness, compositio...

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Bibliographic Details
Main Authors: Yang, Tsuo-Chuan, 楊祚權
Other Authors: Yang, Zu-Po
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/69038172021736887630