Characterization of Lateral Electric Field Induced Nitride Trapped Charge Movement in SONOS
碩士 === 國立交通大學 === 電子研究所 === 105 === In this thesis, we use single device to emulate the pattern effect in NAND string in order to analyze the physical mechanism of charge lateral migration. The sufficient lateral electric field is the key to detect the charge lateral migration signal. In here, we di...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28527891046062600600 |