Investigation of Trapped Charge Distribution and Program disturbance in Non-Volatile Memory Devices
博士 === 國立交通大學 === 電信工程研究所 === 105 === This thesis investigates the trapped charge distribution and program disturbance in non-volatile flash memory devices. It consists of two research topics: one is the study of trapped charge distribution in p-channel silicon-oxide-nitride-oxide-silicon (SONOS) me...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/ak6ceb |