A Performance Metric of Ratio Mismatch for Array Block Placement

碩士 === 國立中央大學 === 電機工程學系 === 105 === As the evolution of semiconductor process technology, the process variation will be more and more serious in device mismatch and parameter variation of components. The performance of many types of analog circuits, like ADC, filter, etc., relies on the implementat...

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Bibliographic Details
Main Authors: Chih-Chia Yang, 楊志嘉
Other Authors: Ju-E Chen
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/78e9q9