Research on the Measurement of Emissivity Based on Radiation Temperature
碩士 === 國立彰化師範大學 === 機電工程學系所 === 105 === Correct and reliable temperature measurement is necessary for the industry, The accuracy of the non-contact temperature measurement is related to the specific surface emissivity of the object. In this study, cold and hot wafers were used as the blackbody. Five...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/3twp2t |