Predicting Residual Useful Lifetime of Circuit Breakers Using K-Medoids and Holt-Winters Algorithms
碩士 === 國立彰化師範大學 === 機電工程學系所 === 105 === ABSTRACT The purpose of this essay is to focus on the prediction of the circuit breakers’ residual useful lifetime. Now the circuit breakers’useful lifetime is provided by the reliability test which is set up before leaving the factory. Its test conditions are...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/9242a7 |