A Study of Hot Carrier Effects of N Channel FinFETs
碩士 === 國立清華大學 === 電子工程研究所 === 105 === In 1980, hot carrier instability (HCI) is the main problem of reliability in semiconductor industry. With the proposition of the Lucky Electron Model (LEM), the behavior of HC was well explained. However, based on LEM we expect that HCI will be unimportant for...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3esv2p |