A Leakage-Current Sensor Enhanced Memory BIST for Defect Level Reduction
碩士 === 國立清華大學 === 電機工程學系 === 105 === Semiconductor memory is considered an essential component in almost all electronic systems. Increasing the yield and reliability of semiconductor memory becomes a more and more important issue. It is well known that in advanced process technologies, more and more...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/z86357 |