Characterizations and Analyses of Deep-ultraviolet AlxGa1-xN/AlyGa1-yN (x < y) Quantum Wells with Thin Barriers of Elevated Aluminum Contents
碩士 === 國立臺灣大學 === 光電工程學研究所 === 105 === The material characterization techniques of transmission electron microscopy observation, reciprocal space mapping and ω-2θ scan in X-ray diffraction measurement, and geometric phase analysis are used for first identifying the existence of the high-aluminum lay...
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| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5z5db6 |