Improving Bridging Fault Coverage by Parallel Search Space Partitioning ATPG
碩士 === 國立臺灣大學 === 電子工程學研究所 === 105 === Because of the shrinking feature sizes of modern IC’s (Integrated Circuit) and the in-creasing design complexity, single stuck-at fault model is no longer sufficient to achieve the desired defect coverage. To increase the defect coverage, in this thesis, we ut...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2017
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Online Access: | http://ndltd.ncl.edu.tw/handle/znaz7d |