Improving Bridging Fault Coverage by Parallel Search Space Partitioning ATPG

碩士 === 國立臺灣大學 === 電子工程學研究所 === 105 === Because of the shrinking feature sizes of modern IC’s (Integrated Circuit) and the in-creasing design complexity, single stuck-at fault model is no longer sufficient to achieve the desired defect coverage. To increase the defect coverage, in this thesis, we ut...

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Bibliographic Details
Main Authors: Fang-Yu Liu, 劉芳瑜
Other Authors: Jiun-Lang Huang
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/znaz7d