A Novel Design of Hybrid Microscope by Integrating Atomic-Force Microscope and Confocal Laser Scanning Microscope
碩士 === 國立臺灣大學 === 電機工程學研究所 === 105 === Atomic force microscope (AFM) and confocal laser scanning microscope (CLSM) can obtain the sample’s three-dimensional (3D) surface profile with the nanometer and sub-micron resolution, respectively. These two types of scanning instrument have been widely used i...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/bcg4g7 |