The Investigation of Defect Distribution of NFinFET by Random Telegraph Noise

碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 106

Bibliographic Details
Main Authors: CHEN,YU-LIN, 陳右霖
Other Authors: Yeh, Wen-Kuan
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/xb9awr