The Investigation of Defect Distribution of NFinFET by Random Telegraph Noise
碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 106
Main Authors: | CHEN,YU-LIN, 陳右霖 |
---|---|
Other Authors: | Yeh, Wen-Kuan |
Format: | Others |
Language: | zh-TW |
Published: |
2018
|
Online Access: | http://ndltd.ncl.edu.tw/handle/xb9awr |
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