A Modified BAST for Test Data Reduction Using Correlation of ATPG Pattern
碩士 === 南臺科技大學 === 電機工程系 === 105 === In order to reduce the test data for BAST (BIST-Aided Scan Test), an LFSR reseeding circuit with additional MUXs (Multiplexer) and NOT gates are proposed. The procedure to generate the control signals for optimal reseeding of the circuit are proposed by making co...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5u939p |