Subtle defect detection in non-periodical pattern images using Fourier reconstruction
碩士 === 元智大學 === 工業工程與管理學系 === 105 === For defect detection in non-periodically patterned images, such as printed-circuit board (PCB) or integrated circuit (IC) die found in the electronic industry, template matching techniques are popularly used to solve the problem. The sum of squared differences (...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07639330080952670133 |