Arithmetic Progression Segmented Extended Frequency-directed Run-length Coding for Test Data Compression
碩士 === 元智大學 === 資訊工程學系 === 105 === Due to advances in VLSI technology, a huge amount of test data complex the test process and also increase the testing time. Test data compression is a common and efficient method for the purpose of saving test data and testing time. In this thesis, we use statistic...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5353gt |