Alignment-Free Error Correction for Third-Generation Sequencing by Adaptive Seed Identification

碩士 === 國立中正大學 === 資訊工程研究所 === 106 === The thrid-generation sequencing technology is now commonly used for de novo assembly projects because of longer reads, less sequencing bias, and more uniform coverage. However, it comes at the cost of higher error rate, which requires error correction prior to a...

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Bibliographic Details
Main Authors: LEE, KUAN-WEI, 李冠緯
Other Authors: HUANG, YAO-TING
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/ze4j89