Verification of Charge-Based Model for Field Effect Transistors under Near-Threshold Operation

碩士 === 長庚大學 === 電子工程學系 === 106

Bibliographic Details
Main Authors: Yung Hsuan Huang, 黃詠萱
Other Authors: K. C. Liu
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/r76mx9