Application of Lean Six Sigma to Improve Final Test Process

碩士 === 中華大學 === 工業管理學系 === 106 === Efficiently Rework of the integrated circuit (IC) seems to become an important factor that need to be conquered because of the consumer electronics produced and assembled continuously progress in recently decades. The IC-testing environments are full of many uncert...

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Bibliographic Details
Main Author: 張基廣
Other Authors: Liu, Kuang-Tai
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/swcbt9