Investigation of charge trapping/de-trapping behavior and photosensing characteristics in thin film transistors with AZO nanoparticle charge trapping layer
碩士 === 國立成功大學 === 材料科學及工程學系 === 106 === In this study, the relationship between charge trapping/de-trapping behavior and photosensing characteristics are studied. There are three different stack structures of thin film transistors are under discussion, for each is (1) Al/ZTO/Al2O3/AZO/SiO2/p+Si char...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/dgh8bv |