Development of periodic microstructure defects detection system using machine vision

碩士 === 國立成功大學 === 機械工程學系 === 106 === When the wavelength of the incident light is close to the linewidth of the periodic microstructures, the incident light interacts with the surface structure and generate diffraction. This feature allows the periodic microstructures to be used in many optical and...

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Bibliographic Details
Main Authors: Ting-XuanHuang, 黃庭軒
Other Authors: Yu-Bin Chen
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/p3puew