Variation-Aware Iddq Testing and Diagnosis
博士 === 國立交通大學 === 電信工程研究所 === 106 === Iddq testing has been used for decades to identify potential defective chips because the measurement results of those chips are out of the electrical range. Pre-defined threshold values from design specification overlooks the influence of process variations, and...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/49dmne |