Minimization of Potential Induced Degradation for Silicon Based Solar Cells

碩士 === 國立交通大學 === 工學院半導體材料與製程設備學程 === 106 === Potential induced degradation (PID) is an important reliability issue in the silicon-based solar energy technology. This problem greatly degrades the photoconversion efficiency of the solar cell module and, in the worst case, results in the overall failu...

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Bibliographic Details
Main Authors: Chen,Yen-Yu, 陳彥佑
Other Authors: Pan,Fu-Ming
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/6u9276