Electromigration Study of Ni/SnAg/Ni Flip-Chip Solder Joints

碩士 === 國立交通大學 === 工學院半導體材料與製程設備學程 === 106 === As the size of electronic products continues to shrink, the circuit design of Flip Chip ICs have to take into account the electromigration effect due to high operation temperature and high current density. Flip-chip technology has become a mainstream tre...

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Bibliographic Details
Main Authors: Wu, Wei-Ming, 吳偉銘
Other Authors: Chen, Chih
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/rgda7y