A Built-In Self-Test Scheme Covering Hard-to-Detect Defects in FinFET-Based SRAM
碩士 === 國立清華大學 === 電機工程學系所 === 106
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/fcd25a |