Sensing of Streptococcus Mutans by Microscopic Imaging Ellipsometry
博士 === 國立清華大學 === 工程與系統科學系 === 106 === Microscopic Imaging Ellipsometry (MIE) is an optical technique that uses an objective and sensing procedure to measure the ellipsometric parameters Psi (Ψ) and Delta (Δ) in the form of microscopic maps. This technique is well known for being non-contact, non-de...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/vqjc88 |